PANNE : Kernel Panic - attempting to kill unit

Forum dédié à la distribution du même nom et que vous pourrez télécharger sur http://www.contribs.org. La nouvelle version de cette distribution se nomme SME Server. Une description est donnée sur le portail phénIXUS : http://www.ixus.net/sme-server/.

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:21

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD5Z1W
Firmware Version: 3.AAF
User Capacity: 250 059 350 016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:20:05 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 41) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 86
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 13
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 255318456
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30030
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 86
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 072 050 045 Old_age Always - 28 (Min/Max 13/50)
194 Temperature_Celsius 0x0022 028 050 000 Old_age Always - 28 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 079 054 000 Old_age Always - 67418115
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Interrupted (host reset) 90% 30030 -
# 2 Short offline Completed without error 00% 30030 -
# 3 Short offline Completed without error 00% 30030 -
# 4 Short offline Completed without error 00% 30030 -
# 5 Short offline Completed without error 00% 29953 -
# 6 Short offline Completed without error 00% 29953 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:28

Disque SDA

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD49HE
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:26:19 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 89
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 066 060 030 Pre-fail Always - 4744041
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30033
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 89
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 072 049 045 Old_age Always - 28 (Min/Max 13/51)
194 Temperature_Celsius 0x0022 028 051 000 Old_age Always - 28 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 083 054 000 Old_age Always - 12214138
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 114 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 114 occurred at disk power-on lifetime: 29969 hours (1248 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:05:44.334 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:05:44.334 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:05:44.210 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:05:44.210 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:05:42.106 SET MAX ADDRESS EXT

Error 113 occurred at disk power-on lifetime: 29969 hours (1248 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:05:29.699 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:05:29.258 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:05:29.258 SET MAX ADDRESS EXT
27 00 01 6f 59 1c e0 00 00:05:29.258 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:05:42.106 READ MULTIPLE EXT

Error 112 occurred at disk power-on lifetime: 29954 hours (1248 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:03:44.270 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:03:44.219 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:03:44.218 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:03:44.218 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:03:56.366 SET MAX ADDRESS EXT

Error 111 occurred at disk power-on lifetime: 29954 hours (1248 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:03:44.270 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:03:44.219 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:03:44.218 SET MAX ADDRESS EXT
27 00 01 6f 59 1c e0 00 00:03:44.218 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:03:44.218 READ MULTIPLE EXT

Error 110 occurred at disk power-on lifetime: 29954 hours (1248 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:08:37.631 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:08:37.507 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:08:37.507 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:08:35.403 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:08:35.403 SET MAX ADDRESS EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29955 -
# 2 Short offline Completed without error 00% 29955 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:33

Disque Sdc
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD4P8J
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:30:42 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 89
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 303716735
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30031
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 89
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 069 051 045 Old_age Always - 31 (Min/Max 14/49)
194 Temperature_Celsius 0x0022 031 049 000 Old_age Always - 31 (0 14 0 0)
195 Hardware_ECC_Recovered 0x001a 087 058 000 Old_age Always - 150009437
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29953 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:35

Disque SDC

smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-23-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD4P8J
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:32:53 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 89
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 303716759
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30031
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 89
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 068 051 045 Old_age Always - 32 (Min/Max 14/49)
194 Temperature_Celsius 0x0022 032 049 000 Old_age Always - 32 (0 14 0 0)
195 Hardware_ECC_Recovered 0x001a 087 058 000 Old_age Always - 150028352
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29953 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:36

GA-MA78G-DS3H:~$ sudo smartctl -a /dev/sdb
[sudo] password for patrice:
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-23-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD72BA
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:35:09 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 88
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 306480112
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30030
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 88
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 074 048 045 Old_age Always - 26 (Min/Max 13/52)
194 Temperature_Celsius 0x0022 026 052 000 Old_age Always - 26 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 077 049 000 Old_age Always - 135024333
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:35.771 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:35.648 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:35.647 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:15:33.543 SET MAX ADDRESS EXT

Error 1 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:28.958 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 01 6f 59 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:15:33.543 READ MULTIPLE EXT

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:40

patrice@patrice-GA-MA78G-DS3H:~$ sudo smartctl -a /dev/sdb
[sudo] password for patrice:
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-23-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD72BA
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:38:35 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 88
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 306480138
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30031
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 88
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 074 048 045 Old_age Always - 26 (Min/Max 13/52)
194 Temperature_Celsius 0x0022 026 052 000 Old_age Always - 26 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 077 049 000 Old_age Always - 135043315
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:35.771 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:35.648 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:35.647 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:15:33.543 SET MAX ADDRESS EXT

Error 1 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:28.958 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 01 6f 59 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:15:33.543 READ MULTIPLE EXT

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

patrice@patrice-GA-MA78G-DS3H:~$ sudo smartctl -a /dev/sdb
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-23-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250410AS
Serial Number: 6RYD72BA
Firmware Version: 3.AAF
User Capacity: 250 058 268 160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Aug 27 18:40:08 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x0001) SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 88
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 306480162
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 30031
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 88
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 074 048 045 Old_age Always - 26 (Min/Max 13/52)
194 Temperature_Celsius 0x0022 026 052 000 Old_age Always - 26 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 077 049 000 Old_age Always - 135062362
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:35.771 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:35.648 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:35.647 SET MAX ADDRESS EXT
27 00 01 2e 51 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
37 00 01 2e 51 1c ed 00 00:15:33.543 SET MAX ADDRESS EXT

Error 1 occurred at disk power-on lifetime: 29946 hours (1247 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 00 01 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 00 2e 51 1c e0 00 00:15:28.958 READ NATIVE MAX ADDRESS EXT
37 00 00 2e 51 1c ed 00 00:15:28.958 SET MAX ADDRESS EXT
27 00 01 6f 59 1c e0 00 00:15:33.543 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:15:33.543 READ MULTIPLE EXT

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 17:46

patrice@patrice-GA-MA78G-DS3H:~$ sudo mdadm --examine --scan /dev/sdd1

ARRAY /dev/md0 UUID=d0ee9027:f0bc9e82:012c3ef5:5d73a3ee

Bon, je n'ai pas fais moi de tentative de reconstruction car je ne sais pas. L'ordi est passé chez un prestataire. Celui-ci nous dit de n'avoir rien tenté. J'en doute
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par unnilennium » 27 Août 2012 18:08

/dev/sdb, Serial Number: 6RYD72BA est défectueux.

il faut travailler à remonter le raid sans lui.

Quel est l'objectif principal : récupérer les données ou repartir la machine ?

La solution la plus sage serait comme disais Jibé : cloner des disque, tentative de remonter les disques clonés dans le raid puis récupérer les données sur un autre disque, et enfin tenter de relancer le serveur.
De cette façon si cela échoue les disques originaux sont toujours dans le même état, et dès que les données ont été rendues accessibles, on les sauvegarde.
unnilennium
 
Message(s) : 218
Inscription : 28 Nov 2011 19:32
Localisation : Québec, QC, Canada

Re: PANNE : Kernel Panic - attempting to kill unit

Message par pkege » 27 Août 2012 20:26

Bonsoir,

La priorité ceux sont les données bien sur. J'attends l'accord pour l'achat de 4 disques dur
pkege
 
Message(s) : 48
Inscription : 17 Juil 2012 08:55

Re: PANNE : Kernel Panic - attempting to kill unit

Message par jibe » 27 Août 2012 23:46

Salut,

Bon, je crois que je vais définitivement passer pour un emmerdeur jamais content, mais tant pis !

Commençons par le bon côté des choses : on avance !

Enfin, on s'en donne l'illusion : j'aurais préféré qu'on avance avec méthode : je ne sais pas comment on peut travailler dans ces conditions ! On m'a toujours appris qu'on bâtit une maison en suivant un plan, qu'on élabore un programme avec un papier et un crayon, pas en se jetant tête baissée à "pisser de la ligne". Mais c'est vrai que je suis de la vieille école et que maintenant, tout est beaucoup mieux : on procède par essais-erreurs, et quand la catastrophe arrive on prend des cachets, on appelle au secours et on s'empresse de faire le contraire de ce qu'on nous conseille...

Or, j'avais conseillé de ne pas remettre en route les disques. Pourquoi demander des conseils si c'est pour ne pas les suivre ??? On se fout royalement des résultats SMART au moins dans un premier temps, et j'avais bien dit que les analyses par fdisk et mdadm se feraient aussi bien et sans aucun risque sur les clones. Bon, en l’occurrence, les disques semblent avoir beaucoup moins souffert que ce que je craignais, c'est une chance, parce qu'il y aurait eu probablement de la casse !

Et quitte à prendre des risques pour faire tous ces tests, ce serait pas mal d'en avoir les résultats de manière lisible. 7 posts de résultats pour 4 disques, certains posts concernant de plus deux disques, j'ai renoncé à comprendre. Ce genre de résultats est suffisamment pénible à lire et interpréter pour ne pas ajouter une telle confusion ! Ce serait bien d'éditer les posts pour qu'ils concernent chacun un disque, avec une présentation identique et bien mis en valeur les références permettant de savoir au premier coup d'oeil de quel disque il s'agit. Et bien sûr de supprimer les posts qui font double emploi (ou s'il y a des tests différents, de bien préciser de quel test il s'agit).

Confusion aussi dans les résultats de mdadm, mais cela a déjà été relevé par unnilennium. On attend les données exactes, précises et complètes. J'avais prévenu que la première chose absolument indispensable en pareil cas est d'avoir de la rigueur !

D'autre part, comment ces tests ont-ils été faits ? Manifestement, sous Ubuntu ou une distrib similaire, si j'en juge par l'emploi systématique de "sudo". Mais s'agit-il d'un live CD utilisé sur le serveur, ou les disques ont-ils été montés sur un autre système ? Trop de questions sans réponse, trop d'imprécisions pour que je considère les résultats donnés comme fiables et que je me base dessus. Ils sont probablement bons à 90%, mais le "probablement" et le 10% manquants pourraient tout faire rater.

A vouloir aller vite au lieu d'aller méthodiquement comme je le préconise dès le début, on en est à la 4° page du fil et ni j'ai encore compris ce qui s'est passé (le serveur a chauffé, mais les températures enregistrées sont assez basses !!!), ni comment a été monté le raid (quel tuto ???), et pour moi on est encore loin de pouvoir commencer le boulot si on veut se donner un maximum de chances de réussite.

Il y a deux méthodes : on tente n'importe quoi sans plan d'action, en comptant sur la chance pour que tout aille bien, ou on fait le point des moyens souhaitables et possibles, on trouve un compromis acceptable, on définit un plan d'action qu'on met en œuvre en analysant les résultats obtenus à chaque étape pour corriger le tir si nécessaire. Choisissez celle que vous préférez. Pour ma part, j'ai toujours pu récupérer les données lorsque c'était faisable par des moyens logiciels, et je n'ai jamais mis tant de temps pour le faire, mais hormis à mes débuts (j'ai eu la chance du débutant Image) je n'ai jamais fait tourner un disque plus que nécessaire et j'ai toujours établi mon plan d'action précisément avant de faire quoi que ce soit (ne serait-ce, justement, que pour ne mettre en route le disque que le strict temps nécessaire).

J'aiderai comme promis en appliquant la méthode qui m'a toujours réussi, mais si je gêne pour appliquer l'autre, je peux me retirer...
jibe. En vert ou en rouge-orangé : je modère - En noir ou autre couleur : je parle à titre personnel.

L'idée que quand on n'a pas quelque chose, on puisse se bouger pour l'avoir, c'est une démarche qui parait absolument normale pour les gens du Logiciel Libre et totalement surnaturelle pour tout le reste de la population. (Benjamin Bayart)
jibe
 
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Inscription : 09 Sep 2011 23:19
Localisation : Haute Savoie

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